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Fault Lines: Benchmarking the Impact of Label Data Quality on ML Robustness and Fairness

Summary: Fault Lines benchmarks 22 classifiers across 15 datasets with diverse label-noise corruptions, jointly measuring predictive robustness and fairness. Biased noise—even below 10%—is far more damaging than random noise, with architecture-dependent resilience and fairness failures. (summarized by gpt-5.6-luna on Jul 24 2026)

Paper ID
14550
Venue
VLDB
Year
2026
Pagerank
5.093636e-05
Overall Rank
10,604 | 27.25%
DOI
10.14778/3785297.3785308

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BibTeX Citation

@article{jackson_vldb26,
        title = {{Fault Lines: Benchmarking the Impact of Label Data Quality on ML Robustness and Fairness}},
        author = {Jackson, David and Groth, Paul and Harmouch, Hazar},
        journal = {PVLDB},
        series = {{VLDB} '26},
        volume = {19},
        number = {4},
        pages = {670--683},
        doi = {10.14778/3785297.3785308},
        url = {https://doi.org/10.14778/3785297.3785308},
        year = {2026}
}

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Citations counted here include only citations to other VLDB/SIGMOD/CIDR/PODS papers in this database.

Rank Cited Paper Year Venue Pagerank
1,340 Responsible Data Management 2020 VLDB 0.00011111667
3,580 Automatic Data Repair: Are We Ready to Deploy? 2024 VLDB 7.2888516e-05
6,928 How do Categorical Duplicates Affect ML? A New Benchmark and Empirical Analyses 2024 VLDB 5.7370426e-05
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