Far-and-Near: Co-Designed Storage Reliability Between Database and SSDs
Summary: Proposes co-designed DBMS–SSD reliability: 'far' ECC (shift part of ECC into the DBMS) and 'near' ECC (earlier in-device ECC) to avoid redundant parity and enable fine-grained reads. Aims to reduce I/O latency, data movement and space amplification while giving stronger application-aware reliability. (summarized by gpt-5-mini on Feb 09 2026)
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Authors
- 1. Jinwoo Jeong (Hanyang University)
- 2. Kibin Park (Hanyang University)
- 3. Sangjin Lee (IT University of Copenhagen)
- 4. Philippe Bonnet (IT University of Copenhagen)
- 5. Alberto Lerner (University of Freiburg)
- 6. Philippe Cudre-Mauroux (University of Freiburg)
BibTeX Citation
@inproceedings{jeong_cidr23,
address = {Amsterdam, Netherlands},
series = {{CIDR} '23},
title = {{Far-and-Near: Co-Designed Storage Reliability Between Database and SSDs}},
booktitle = {Proceedings of the {Conference} on {Innovative} {Data} {Systems} {Research}},
author = {Jeong, Jinwoo and Park, Kibin and Lee, Sangjin and Bonnet, Philippe and Lerner, Alberto and Cudre-Mauroux, Philippe},
year = {2023}
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