Far-and-Near: Co-Designed Storage Reliability Between Database and SSDs
Summary: Proposes co-designed DBMS–SSD reliability: 'far' ECC (shift part of ECC into the DBMS) and 'near' ECC (earlier in-device ECC) to avoid redundant parity and enable fine-grained reads. Aims to reduce I/O latency, data movement and space amplification while giving stronger application-aware reliability. (summarized by gpt-5-mini on Feb 09 2026)
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Authors
- 1. Jinwoo Jeong
- 2. Kibin Park
- 3. Sangjin Lee
- 4. Philippe Bonnet
- 5. Alberto Lerner
- 6. Philippe Cudre-Mauroux
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